New method for studying semiconducting surfaces in air by scanning tunneling microscopy (1997)
- Authors:
- Autor USP: QUIVY, ALAIN ANDRE - IF
- Unidade: IF
- Assunto: SEMICONDUTORES
- Language: Inglês
- Source:
- Título do periódico: Modern Physics Letters B
- Volume/Número/Paginação/Ano: v. 10, n. 24, p. 1189-1195, 1997
-
ABNT
FERLAUTO, A S e QUIVY, A. A. New method for studying semiconducting surfaces in air by scanning tunneling microscopy. Modern Physics Letters B, v. 10, n. 24, p. 1189-1195, 1997Tradução . . Acesso em: 09 jun. 2024. -
APA
Ferlauto, A. S., & Quivy, A. A. (1997). New method for studying semiconducting surfaces in air by scanning tunneling microscopy. Modern Physics Letters B, 10( 24), 1189-1195. -
NLM
Ferlauto AS, Quivy AA. New method for studying semiconducting surfaces in air by scanning tunneling microscopy. Modern Physics Letters B. 1997 ; 10( 24): 1189-1195.[citado 2024 jun. 09 ] -
Vancouver
Ferlauto AS, Quivy AA. New method for studying semiconducting surfaces in air by scanning tunneling microscopy. Modern Physics Letters B. 1997 ; 10( 24): 1189-1195.[citado 2024 jun. 09 ] - Microscopio de tunelamento a ser usado no ar, no vacuo e no helio liquido
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