Thickness and roughness measurements in poly(o-methoxyaniline) layer-by-layer films using AFM (1999)
- Authors:
- USP affiliated authors: SILVA, MARCELO DE ASSUMPCAO PEREIRA DA - IFSC ; FARIA, ROBERTO MENDONCA - IFSC ; OLIVEIRA JUNIOR, OSVALDO NOVAIS DE - IFSC
- Unidade: IFSC
- Assunto: MATÉRIA CONDENSADA
- Language: Inglês
- Imprenta:
- Publisher: IEEE
- Publisher place: Piscataway
- Date published: 1999
- Source:
- Título do periódico: Proceedings
- Conference titles: International Symposium on Electrets
-
ABNT
RAPOSO, Maria et al. Thickness and roughness measurements in poly(o-methoxyaniline) layer-by-layer films using AFM. 1999, Anais.. Piscataway: IEEE, 1999. . Acesso em: 16 maio 2024. -
APA
Raposo, M., Lobo, R. F. M., Silva, M. de A. P. da, Faria, R. M., & Oliveira Junior, O. N. de. (1999). Thickness and roughness measurements in poly(o-methoxyaniline) layer-by-layer films using AFM. In Proceedings. Piscataway: IEEE. -
NLM
Raposo M, Lobo RFM, Silva M de AP da, Faria RM, Oliveira Junior ON de. Thickness and roughness measurements in poly(o-methoxyaniline) layer-by-layer films using AFM. Proceedings. 1999 ;[citado 2024 maio 16 ] -
Vancouver
Raposo M, Lobo RFM, Silva M de AP da, Faria RM, Oliveira Junior ON de. Thickness and roughness measurements in poly(o-methoxyaniline) layer-by-layer films using AFM. Proceedings. 1999 ;[citado 2024 maio 16 ] - Layer-by-layer growth morphology of polymer/polyelectrolyte ultra-thin films studied by atomic force microscopy
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- Surface energy characterization of light-emitting diodes by Atomic Force Microscopy (AFM): contact angle and surface energy determination
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