Characterization of porous silicon by photoluminescence, ellipsometric and micro-Raman spectroscopies (1999)
- Authors:
- USP affiliated authors: FERNANDEZ, FRANCISCO JAVIER RAMÍREZ - EP ; SALCEDO, WALTER JAIMES - IQ
- Unidades: EP; IQ
- Assunto: MICROSCOPIA ELETRÔNICA
- Language: Inglês
- Imprenta:
-
ABNT
SALCEDO, Walter Jaimes e RAMÍREZ FERNANDEZ, Francisco Javier. Characterization of porous silicon by photoluminescence, ellipsometric and micro-Raman spectroscopies. . São Paulo: EPUSP. . Acesso em: 01 maio 2024. , 1999 -
APA
Salcedo, W. J., & Ramírez Fernandez, F. J. (1999). Characterization of porous silicon by photoluminescence, ellipsometric and micro-Raman spectroscopies. São Paulo: EPUSP. -
NLM
Salcedo WJ, Ramírez Fernandez FJ. Characterization of porous silicon by photoluminescence, ellipsometric and micro-Raman spectroscopies. 1999 ;[citado 2024 maio 01 ] -
Vancouver
Salcedo WJ, Ramírez Fernandez FJ. Characterization of porous silicon by photoluminescence, ellipsometric and micro-Raman spectroscopies. 1999 ;[citado 2024 maio 01 ] - Self-assembled polystyrene micro-spheres applied for photonic crystals and templates fabrication
- Photonic band structure of periodic-like porous silicon
- Polarization effects on the Raman and photoluminescence spectra of porous silicon layers
- Influencia da umidade e recozimento no comportamento do silicio poroso
- Caracterizacao estrutural do silicio poroso
- Formacao de microporos de silicio
- 2-D and 3-D photonic crystals fabrication by self-assembling of polystyrene micro spheres
- The effect of the thermal annealing on the porous silicon bragg reflector
- Microporos em silicio para aplicacoes em sensores
- Polarization effect on Raman scattering and photoluminescence spectra in porous silicon layer
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