High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001) (1999)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- DOI: 10.1107/s0909049598012953
- Assunto: CRISTALOGRAFIA
- Language: Inglês
- Imprenta:
- Publisher place: Copenhagen
- Date published: 1999
- Source:
- Título do periódico: Journal of Synchrotron Radiation
- ISSN: 0909-0495
- Volume/Número/Paginação/Ano: v. 6, p. 29-33, 1999
- Este periódico é de assinatura
- Este artigo é de acesso aberto
- URL de acesso aberto
- Cor do Acesso Aberto: bronze
-
ABNT
HAYASHI, M. A. et al. High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001). Journal of Synchrotron Radiation, v. 6, p. 29-33, 1999Tradução . . Disponível em: https://doi.org/10.1107/s0909049598012953. Acesso em: 21 maio 2024. -
APA
Hayashi, M. A., Avanci, L. H., Cardoso, L. P., Carvalho, M. M. G. de, Morelhao, S. L., & Collins, S. P. (1999). High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001). Journal of Synchrotron Radiation, 6, 29-33. doi:10.1107/s0909049598012953 -
NLM
Hayashi MA, Avanci LH, Cardoso LP, Carvalho MMG de, Morelhao SL, Collins SP. High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001) [Internet]. Journal of Synchrotron Radiation. 1999 ; 6 29-33.[citado 2024 maio 21 ] Available from: https://doi.org/10.1107/s0909049598012953 -
Vancouver
Hayashi MA, Avanci LH, Cardoso LP, Carvalho MMG de, Morelhao SL, Collins SP. High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001) [Internet]. Journal of Synchrotron Radiation. 1999 ; 6 29-33.[citado 2024 maio 21 ] Available from: https://doi.org/10.1107/s0909049598012953 - Enhanced X-ray phase determination by three-beam diffraction
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Informações sobre o DOI: 10.1107/s0909049598012953 (Fonte: oaDOI API)
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