Magnetic hysteresis of the critical current density of polycrystalline (Bi-Pb)-Sr-Ca-Cu-O superconductors: a fingerprint of the intragranular and intergranular flux trapping (2001)
- Authors:
- Autor USP: JARDIM, RENATO DE FIGUEIREDO - IF
- Unidade: IF
- Assunto: SUPERCONDUTIVIDADE
- Language: Inglês
- Imprenta:
- Source:
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ABNT
MUNE, P e GOVEA-ALCAIDE, E e JARDIM, R. F. Magnetic hysteresis of the critical current density of polycrystalline (Bi-Pb)-Sr-Ca-Cu-O superconductors: a fingerprint of the intragranular and intergranular flux trapping. Physica C, v. 354, n. 1-4, p. 275-278, 2001Tradução . . Disponível em: http://e5500.fapesp.br/cgi-bin/sciserv.pl?collection=journals&journal=09214534&issue=v354i1-4&article=275_mhotcctiaift&form=pdf&file=file.pdf. Acesso em: 20 maio 2024. -
APA
Mune, P., Govea-Alcaide, E., & Jardim, R. F. (2001). Magnetic hysteresis of the critical current density of polycrystalline (Bi-Pb)-Sr-Ca-Cu-O superconductors: a fingerprint of the intragranular and intergranular flux trapping. Physica C, 354( 1-4), 275-278. Recuperado de http://e5500.fapesp.br/cgi-bin/sciserv.pl?collection=journals&journal=09214534&issue=v354i1-4&article=275_mhotcctiaift&form=pdf&file=file.pdf -
NLM
Mune P, Govea-Alcaide E, Jardim RF. Magnetic hysteresis of the critical current density of polycrystalline (Bi-Pb)-Sr-Ca-Cu-O superconductors: a fingerprint of the intragranular and intergranular flux trapping [Internet]. Physica C. 2001 ; 354( 1-4): 275-278.[citado 2024 maio 20 ] Available from: http://e5500.fapesp.br/cgi-bin/sciserv.pl?collection=journals&journal=09214534&issue=v354i1-4&article=275_mhotcctiaift&form=pdf&file=file.pdf -
Vancouver
Mune P, Govea-Alcaide E, Jardim RF. Magnetic hysteresis of the critical current density of polycrystalline (Bi-Pb)-Sr-Ca-Cu-O superconductors: a fingerprint of the intragranular and intergranular flux trapping [Internet]. Physica C. 2001 ; 354( 1-4): 275-278.[citado 2024 maio 20 ] Available from: http://e5500.fapesp.br/cgi-bin/sciserv.pl?collection=journals&journal=09214534&issue=v354i1-4&article=275_mhotcctiaift&form=pdf&file=file.pdf - Phonon meam free path evaluation in high tc oxides
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