Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications (2003)
- Authors:
- Autor USP: YOSHIMURA, ELISABETH MATEUS - IF
- Unidade: IF
- Subjects: MEDICINA NUCLEAR; SEMICONDUTORES; ESPECTROSCOPIA DE RAIO X
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Book of Abstracts
- Conference titles: International Meeting on Applied Physics
-
ABNT
FREITAS, M B e MEDEIROS, Fernando Homem de Mello e YOSHIMURA, Elisabeth Mateus. Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications. 2003, Anais.. Badajoz: APHYS, 2003. . Acesso em: 01 maio 2024. -
APA
Freitas, M. B., Medeiros, F. H. de M., & Yoshimura, E. M. (2003). Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications. In Book of Abstracts. Badajoz: APHYS. -
NLM
Freitas MB, Medeiros FH de M, Yoshimura EM. Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications. Book of Abstracts. 2003 ;[citado 2024 maio 01 ] -
Vancouver
Freitas MB, Medeiros FH de M, Yoshimura EM. Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications. Book of Abstracts. 2003 ;[citado 2024 maio 01 ] - Determinacao da dose devida a presenca de radonio em ambientes fechados
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