Al thermal diffusion in `alfa´-`Si IND.1-X´`C IND.X´:H Thin Film Studied by XAFS (2007)
- Authors:
- USP affiliated authors: FANTINI, MARCIA CARVALHO DE ABREU - IF ; CARRENO, MARCELO NELSON PAEZ - EP ; PEREYRA, INÊS - EP
- Unidades: IF; EP
- Subjects: FILMES FINOS; DIFRAÇÃO POR RAIOS X
- Language: Inglês
- Imprenta:
- Publisher: The Institute
- Publisher place: New York
- Date published: 2007
- Source:
- Título do periódico: AIP Conference Proceedings
- ISSN: 1551-7616
- Volume/Número/Paginação/Ano: v. 882, p. 529-531, 2007
- Conference titles: X-Ray Absorption Fine Structure - XAFS 13th International Conference
-
ABNT
PRADO, Rogerio Junqueira et al. Al thermal diffusion in `alfa´-`Si IND.1-X´`C IND.X´:H Thin Film Studied by XAFS. AIP Conference Proceedings. New York: The Institute. Disponível em: http://proceedings.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000882000001000529000001&idtype=cvips. Acesso em: 15 maio 2024. , 2007 -
APA
Prado, R. J., Fantini, M. C. de A., Páez Carreño, M. N., Pereyra, I., & Flank, A. M. (2007). Al thermal diffusion in `alfa´-`Si IND.1-X´`C IND.X´:H Thin Film Studied by XAFS. AIP Conference Proceedings. New York: The Institute. Recuperado de http://proceedings.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000882000001000529000001&idtype=cvips -
NLM
Prado RJ, Fantini MC de A, Páez Carreño MN, Pereyra I, Flank AM. Al thermal diffusion in `alfa´-`Si IND.1-X´`C IND.X´:H Thin Film Studied by XAFS [Internet]. AIP Conference Proceedings. 2007 ; 882 529-531.[citado 2024 maio 15 ] Available from: http://proceedings.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000882000001000529000001&idtype=cvips -
Vancouver
Prado RJ, Fantini MC de A, Páez Carreño MN, Pereyra I, Flank AM. Al thermal diffusion in `alfa´-`Si IND.1-X´`C IND.X´:H Thin Film Studied by XAFS [Internet]. AIP Conference Proceedings. 2007 ; 882 529-531.[citado 2024 maio 15 ] Available from: http://proceedings.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000882000001000529000001&idtype=cvips - Microporos em a- 'SI ANTPOT.1-X' 'C ANTPOT.X': h do tipo diamante
- X-Ray Reflectivity of Amorphous Multi Layers: Interface Modeling
- Small angle x-ray scattering in amorphous films and multilayers
- Improved interfaces quality of a-'SI': h / a-'SI IND.1-X''C IND.X' : h multilayers
- Exafs e saxs de filmes finos de a-'SI IND.1-X''C IND.X'
- Highly ordered amosphous silicon-carbon alloys obtained by RF PECVD
- Efeitos dos parametros de deposicao sobre a qualidade de multicamadas de a-'SI': h / a- 'SI ANTPOT.1-X' 'C ANTPOT.X' : h
- Low microvoid density wide gap amorphous silicon carbide
- Structural characterization of a-'SI IND.1-X''C IND.X'
- Effect of plasma etching, carbon concentration, and buffer layer on the properties of a-'SI': h / a-'SI IND.1-X''C IND.X' : h multilayers
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