Thin target PIXE calibration using thick target yields (2011)
- Authors:
- USP affiliated authors: ADDED, NEMITALA - IF ; RIZZUTTO, MARCIA DE ALMEIDA - IF ; TABACNIKS, MANFREDO HARRI - IF
- Unidade: IF
- Assunto: RAIOS X
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Resumo
- Conference titles: International Conference on Ion Beam Analysis
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ABNT
AGUIRRE, F R et al. Thin target PIXE calibration using thick target yields. 2011, Anais.. Itapema: IBA, 2011. Disponível em: http://www.if.ufrgs.br/iba2011/program/124.pdf. Acesso em: 10 maio 2024. -
APA
Aguirre, F. R., Tabacniks, M. H., Rizzuto, M. A., Added, N., & Barbosa, M. D. L. (2011). Thin target PIXE calibration using thick target yields. In Resumo. Itapema: IBA. Recuperado de http://www.if.ufrgs.br/iba2011/program/124.pdf -
NLM
Aguirre FR, Tabacniks MH, Rizzuto MA, Added N, Barbosa MDL. Thin target PIXE calibration using thick target yields [Internet]. Resumo. 2011 ;[citado 2024 maio 10 ] Available from: http://www.if.ufrgs.br/iba2011/program/124.pdf -
Vancouver
Aguirre FR, Tabacniks MH, Rizzuto MA, Added N, Barbosa MDL. Thin target PIXE calibration using thick target yields [Internet]. Resumo. 2011 ;[citado 2024 maio 10 ] Available from: http://www.if.ufrgs.br/iba2011/program/124.pdf - X-ray production yield in standardized thick target PIXE
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