Fully analytical compact model for the Q–V and C–V characteristics of cylindrical junctionless nanowire FETs (2022)
- Authors:
- USP affiliated authors: ROMERO, MURILO ARAUJO - EESC ; SOUZA, ADÉLCIO MARQUES DE - EESC ; CELINO, DANIEL RICARDO - EESC
- Unidade: EESC
- DOI: 10.1016/j.mejo.2021.105324
- Subjects: SEMICONDUTORES; NANOTECNOLOGIA; ENGENHARIA ELÉTRICA
- Language: Inglês
- Imprenta:
- Publisher place: London, UK
- Date published: 2022
- Source:
- Título do periódico: Microelectronics Journal
- ISSN: 0026-2692
- Volume/Número/Paginação/Ano: v. 119, article 105324, p. 1-8, 2022
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
SOUZA, Adelcio Marques de et al. Fully analytical compact model for the Q–V and C–V characteristics of cylindrical junctionless nanowire FETs. Microelectronics Journal, v. 119, p. 1-8, 2022Tradução . . Disponível em: http://dx.doi.org/10.1016/j.mejo.2021.105324. Acesso em: 03 maio 2024. -
APA
Souza, A. M. de, Celino, D. R., Ragi, R., & Romero, M. A. (2022). Fully analytical compact model for the Q–V and C–V characteristics of cylindrical junctionless nanowire FETs. Microelectronics Journal, 119, 1-8. doi:10.1016/j.mejo.2021.105324 -
NLM
Souza AM de, Celino DR, Ragi R, Romero MA. Fully analytical compact model for the Q–V and C–V characteristics of cylindrical junctionless nanowire FETs [Internet]. Microelectronics Journal. 2022 ; 119 1-8.[citado 2024 maio 03 ] Available from: http://dx.doi.org/10.1016/j.mejo.2021.105324 -
Vancouver
Souza AM de, Celino DR, Ragi R, Romero MA. Fully analytical compact model for the Q–V and C–V characteristics of cylindrical junctionless nanowire FETs [Internet]. Microelectronics Journal. 2022 ; 119 1-8.[citado 2024 maio 03 ] Available from: http://dx.doi.org/10.1016/j.mejo.2021.105324 - Analog radio-over-fiber fronthaul by a double cavity self-seeded WDM-PON
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Informações sobre o DOI: 10.1016/j.mejo.2021.105324 (Fonte: oaDOI API)
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