Source: Optical Materials. Unidade: IFSC
Subjects: FILMES FINOS, LUMINESCÊNCIA, TERRAS RARAS
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WEINGÄRTNER, R. et al. Thermal activation, cathodo- and photoluminescence measurements of rare earth doped (Tm, Tb, Dy, Eu, Sm, Yb) amorphous/nanocrystalline AlN thin films prepared by reactive rf-sputtering. Optical Materials, v. 28, n. 6/7, p. 790-793, 2006Tradução . . Disponível em: https://doi.org/10.1016/j.optmat.2005.09.024. Acesso em: 29 maio 2024.APA
Weingärtner, R., Erlenbach, O., Winnacker, A., Welte, A., Brauer, I., Mendel, H., et al. (2006). Thermal activation, cathodo- and photoluminescence measurements of rare earth doped (Tm, Tb, Dy, Eu, Sm, Yb) amorphous/nanocrystalline AlN thin films prepared by reactive rf-sputtering. Optical Materials, 28( 6/7), 790-793. doi:10.1016/j.optmat.2005.09.024NLM
Weingärtner R, Erlenbach O, Winnacker A, Welte A, Brauer I, Mendel H, Strunk HP, Ribeiro CTM, Zanatta AR. Thermal activation, cathodo- and photoluminescence measurements of rare earth doped (Tm, Tb, Dy, Eu, Sm, Yb) amorphous/nanocrystalline AlN thin films prepared by reactive rf-sputtering [Internet]. Optical Materials. 2006 ; 28( 6/7): 790-793.[citado 2024 maio 29 ] Available from: https://doi.org/10.1016/j.optmat.2005.09.024Vancouver
Weingärtner R, Erlenbach O, Winnacker A, Welte A, Brauer I, Mendel H, Strunk HP, Ribeiro CTM, Zanatta AR. Thermal activation, cathodo- and photoluminescence measurements of rare earth doped (Tm, Tb, Dy, Eu, Sm, Yb) amorphous/nanocrystalline AlN thin films prepared by reactive rf-sputtering [Internet]. Optical Materials. 2006 ; 28( 6/7): 790-793.[citado 2024 maio 29 ] Available from: https://doi.org/10.1016/j.optmat.2005.09.024
