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Artigo de periodico
A simple formula for determining nanoparticle size distribution by combining small-angle X-ray scattering and diffraction results (2022)
Sergio L. Morelhão ; Kycia, Stefan
Source: Acta Crystallographica Section A: Foundations and Advances. Unidade: IF
Subjects: FÍSICO-QUÍMICA, CRISTALOGRAFIA DE RAIOS X, NANOPARTÍCULAS, ESPALHAMENTO DE RAIOS X A BAIXOS ÂNGULOS, MATERIAIS NANOESTRUTURADOS
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ABNT
SERGIO L. MORELHÃO, e KYCIA, Stefan. A simple formula for determining nanoparticle size distribution by combining small-angle X-ray scattering and diffraction results. Acta Crystallographica Section A: Foundations and Advances, v. 78, n. 1, p. 459-462, 2022Tradução . . Disponível em: https://doi.org/10.1107/S2053273322007215. Acesso em: 07 jun. 2024.
APA
Sergio L. Morelhão,, & Kycia, S. (2022). A simple formula for determining nanoparticle size distribution by combining small-angle X-ray scattering and diffraction results. Acta Crystallographica Section A: Foundations and Advances, 78( 1), 459-462. doi:10.1107/S2053273322007215
NLM
Sergio L. Morelhão, Kycia S. A simple formula for determining nanoparticle size distribution by combining small-angle X-ray scattering and diffraction results [Internet]. Acta Crystallographica Section A: Foundations and Advances. 2022 ; 78( 1): 459-462.[citado 2024 jun. 07 ] Available from: https://doi.org/10.1107/S2053273322007215
Vancouver
Sergio L. Morelhão, Kycia S. A simple formula for determining nanoparticle size distribution by combining small-angle X-ray scattering and diffraction results [Internet]. Acta Crystallographica Section A: Foundations and Advances. 2022 ; 78( 1): 459-462.[citado 2024 jun. 07 ] Available from: https://doi.org/10.1107/S2053273322007215
Relatorio tecnico
Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films (2020)
Morelhão, Sergio Luiz ; Kycia, Stefan; Netzke, Samuel; Fornari, Celso I.; Rappl, Paulo H. O.; Abramof, Eduardo
Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, SEMICONDUTORES, CRISTALOGRAFIA DE RAIOS X
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ABNT
MORELHÃO, Sergio Luiz et al. Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films. . Melville: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/pdf/2007.15042.pdf. Acesso em: 07 jun. 2024. , 2020
APA
Morelhão, S. L., Kycia, S., Netzke, S., Fornari, C. I., Rappl, P. H. O., & Abramof, E. (2020). Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films. Melville: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/pdf/2007.15042.pdf
NLM
Morelhão SL, Kycia S, Netzke S, Fornari CI, Rappl PHO, Abramof E. Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films [Internet]. 2020 ;[citado 2024 jun. 07 ] Available from: https://arxiv.org/pdf/2007.15042.pdf
Vancouver
Morelhão SL, Kycia S, Netzke S, Fornari CI, Rappl PHO, Abramof E. Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films [Internet]. 2020 ;[citado 2024 jun. 07 ] Available from: https://arxiv.org/pdf/2007.15042.pdf
Relatorio tecnico
Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals (2019)
Morelhão, Sergio Luiz ; Kycia, Stefan; Netzke, Samuel; Fornari, Celso I.; Rappl, Paulo H. O.
Unidade: IF
Subjects: NANOPARTÍCULAS, RAIOS X
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ABNT
MORELHÃO, Sergio Luiz et al. Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/abs/1911.00396. Acesso em: 07 jun. 2024. , 2019
APA
Morelhão, S. L., Kycia, S., Netzke, S., Fornari, C. I., & Rappl, P. H. O. (2019). Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/abs/1911.00396
NLM
Morelhão SL, Kycia S, Netzke S, Fornari CI, Rappl PHO. Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals [Internet]. 2019 ;[citado 2024 jun. 07 ] Available from: https://arxiv.org/abs/1911.00396
Vancouver
Morelhão SL, Kycia S, Netzke S, Fornari CI, Rappl PHO. Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals [Internet]. 2019 ;[citado 2024 jun. 07 ] Available from: https://arxiv.org/abs/1911.00396
Artigo de periodico
Novel near field detector for three-dimensional X-ray diffraction microscopy (2018)
Annett, Scott; Kycia, Stefan; Dale, Darren; Morelhao, Sergio Luiz
Source: MRS Advances. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, SEMICONDUTORES, CRISTALOGRAFIA DE RAIOS X
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ABNT
ANNETT, Scott et al. Novel near field detector for three-dimensional X-ray diffraction microscopy. MRS Advances, v. 3, n. ju 2018, p. 2341-2346, 2018Tradução . . Disponível em: https://doi.org/10.1557/adv.2018.487. Acesso em: 07 jun. 2024.
APA
Annett, S., Kycia, S., Dale, D., & Morelhao, S. L. (2018). Novel near field detector for three-dimensional X-ray diffraction microscopy. MRS Advances, 3( ju 2018), 2341-2346. doi:10.1557/adv.2018.487
NLM
Annett S, Kycia S, Dale D, Morelhao SL. Novel near field detector for three-dimensional X-ray diffraction microscopy [Internet]. MRS Advances. 2018 ; 3( ju 2018): 2341-2346.[citado 2024 jun. 07 ] Available from: https://doi.org/10.1557/adv.2018.487
Vancouver
Annett S, Kycia S, Dale D, Morelhao SL. Novel near field detector for three-dimensional X-ray diffraction microscopy [Internet]. MRS Advances. 2018 ; 3( ju 2018): 2341-2346.[citado 2024 jun. 07 ] Available from: https://doi.org/10.1557/adv.2018.487
Relatorio tecnico
X-ray tools for van der waals epitaxy of bismuth telluride topological insulator films (2018)
Kycia, Stefan; Netzke, Samuel; Fornari, Celso I.; Rappl, Paulo H. O.; Abramof, Eduardo; Morelhao, Sergio Luiz
Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, SEMICONDUTORES, CRISTALOGRAFIA DE RAIOS X
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ABNT
KYCIA, Stefan et al. X-ray tools for van der waals epitaxy of bismuth telluride topological insulator films. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/abs/1812.10804. Acesso em: 07 jun. 2024. , 2018
APA
Kycia, S., Netzke, S., Fornari, C. I., Rappl, P. H. O., Abramof, E., & Morelhao, S. L. (2018). X-ray tools for van der waals epitaxy of bismuth telluride topological insulator films. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/abs/1812.10804
NLM
Kycia S, Netzke S, Fornari CI, Rappl PHO, Abramof E, Morelhao SL. X-ray tools for van der waals epitaxy of bismuth telluride topological insulator films [Internet]. 2018 ;[citado 2024 jun. 07 ] Available from: https://arxiv.org/abs/1812.10804
Vancouver
Kycia S, Netzke S, Fornari CI, Rappl PHO, Abramof E, Morelhao SL. X-ray tools for van der waals epitaxy of bismuth telluride topological insulator films [Internet]. 2018 ;[citado 2024 jun. 07 ] Available from: https://arxiv.org/abs/1812.10804
Artigo de periodico
Micro grain analysis in plastically deformed silicon by 2nd-order X-ray diffraction (2018)
Dina, Gabriel; Kycia, Stefan; Gonzalez, Anal Gomez; Morelhao, Sergio Luiz
Source: MRS Advances. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, SEMICONDUTORES, CRISTALOGRAFIA DE RAIOS X
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ABNT
DINA, Gabriel et al. Micro grain analysis in plastically deformed silicon by 2nd-order X-ray diffraction. MRS Advances, v. 3, n. ju 2018, p. 2347-2352, 2018Tradução . . Disponível em: https://doi.org/10.1557/adv.2018.511. Acesso em: 07 jun. 2024.
APA
Dina, G., Kycia, S., Gonzalez, A. G., & Morelhao, S. L. (2018). Micro grain analysis in plastically deformed silicon by 2nd-order X-ray diffraction. MRS Advances, 3( ju 2018), 2347-2352. doi:10.1557/adv.2018.511
NLM
Dina G, Kycia S, Gonzalez AG, Morelhao SL. Micro grain analysis in plastically deformed silicon by 2nd-order X-ray diffraction [Internet]. MRS Advances. 2018 ; 3( ju 2018): 2347-2352.[citado 2024 jun. 07 ] Available from: https://doi.org/10.1557/adv.2018.511
Vancouver
Dina G, Kycia S, Gonzalez AG, Morelhao SL. Micro grain analysis in plastically deformed silicon by 2nd-order X-ray diffraction [Internet]. MRS Advances. 2018 ; 3( ju 2018): 2347-2352.[citado 2024 jun. 07 ] Available from: https://doi.org/10.1557/adv.2018.511
Artigo de periodico
Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films (2018)
Morelhao, Sergio Luiz; Kycia, Stefan; Netzke, Samuel; Fornari, Celso I.; Rappl, Paulo H. O.; Abramof, Eduardo
Source: Applied Physics Letters. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, SEMICONDUTORES, CRISTALOGRAFIA DE RAIOS X
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ABNT
MORELHAO, Sergio Luiz et al. Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films. Applied Physics Letters, v. 112, n. 12, p. 101903, 2018Tradução . . Disponível em: https://aip.scitation.org/doi/10.1063/1.5020375. Acesso em: 07 jun. 2024.
APA
Morelhao, S. L., Kycia, S., Netzke, S., Fornari, C. I., Rappl, P. H. O., & Abramof, E. (2018). Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films. Applied Physics Letters, 112( 12), 101903. doi:10.1063/1.5020375
NLM
Morelhao SL, Kycia S, Netzke S, Fornari CI, Rappl PHO, Abramof E. Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films [Internet]. Applied Physics Letters. 2018 ; 112( 12): 101903.[citado 2024 jun. 07 ] Available from: https://aip.scitation.org/doi/10.1063/1.5020375
Vancouver
Morelhao SL, Kycia S, Netzke S, Fornari CI, Rappl PHO, Abramof E. Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films [Internet]. Applied Physics Letters. 2018 ; 112( 12): 101903.[citado 2024 jun. 07 ] Available from: https://aip.scitation.org/doi/10.1063/1.5020375
Trabalho de evento-resumo
Study of crystalline structures by invariant phase triplet measurements (2004)
Perrota, André V; Amaral, Thaís G; Avanci, L. H; Morelhão, Sérgio Luiz; Kycia, Stefan
Source: Resumos. Conference titles: Encontro Nacional de Fisica da Matéria Condensada. Unidade: IF
Subjects: MATÉRIA CONDENSADA, DIFRAÇÃO POR RAIOS X, CRISTALOGRAFIA
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ABNT
PERROTA, André V et al. Study of crystalline structures by invariant phase triplet measurements. 2004, Anais.. São Paulo: SBF, 2004. Disponível em: http://www.sbf1.sbfisica.org.br/eventos/enfmc/xxvii/sys/resumos/R0472-2.pdf. Acesso em: 07 jun. 2024.
APA
Perrota, A. V., Amaral, T. G., Avanci, L. H., Morelhão, S. L., & Kycia, S. (2004). Study of crystalline structures by invariant phase triplet measurements. In Resumos. São Paulo: SBF. Recuperado de http://www.sbf1.sbfisica.org.br/eventos/enfmc/xxvii/sys/resumos/R0472-2.pdf
NLM
Perrota AV, Amaral TG, Avanci LH, Morelhão SL, Kycia S. Study of crystalline structures by invariant phase triplet measurements [Internet]. Resumos. 2004 ;[citado 2024 jun. 07 ] Available from: http://www.sbf1.sbfisica.org.br/eventos/enfmc/xxvii/sys/resumos/R0472-2.pdf
Vancouver
Perrota AV, Amaral TG, Avanci LH, Morelhão SL, Kycia S. Study of crystalline structures by invariant phase triplet measurements [Internet]. Resumos. 2004 ;[citado 2024 jun. 07 ] Available from: http://www.sbf1.sbfisica.org.br/eventos/enfmc/xxvii/sys/resumos/R0472-2.pdf
Artigo de periodico
Enhanced X-ray phase determination by three-beam diffraction (2002)
Morelhão, Sérgio Luiz; Kycia, Stefan
Source: Physical Review Letters. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, ESTRUTURA ELETRÔNICA
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ABNT
MORELHÃO, Sérgio Luiz e KYCIA, Stefan. Enhanced X-ray phase determination by three-beam diffraction. Physical Review Letters, v. 89, n. 1, p. 15501/1-15501/4, 2002Tradução . . Disponível em: http://ojps.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=PRLTAO000089000001015501000001&idtype=cvips. Acesso em: 07 jun. 2024.
APA
Morelhão, S. L., & Kycia, S. (2002). Enhanced X-ray phase determination by three-beam diffraction. Physical Review Letters, 89( 1), 15501/1-15501/4. Recuperado de http://ojps.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=PRLTAO000089000001015501000001&idtype=cvips
NLM
Morelhão SL, Kycia S. Enhanced X-ray phase determination by three-beam diffraction [Internet]. Physical Review Letters. 2002 ; 89( 1): 15501/1-15501/4.[citado 2024 jun. 07 ] Available from: http://ojps.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=PRLTAO000089000001015501000001&idtype=cvips
Vancouver
Morelhão SL, Kycia S. Enhanced X-ray phase determination by three-beam diffraction [Internet]. Physical Review Letters. 2002 ; 89( 1): 15501/1-15501/4.[citado 2024 jun. 07 ] Available from: http://ojps.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=PRLTAO000089000001015501000001&idtype=cvips
Trabalho de evento-resumo
Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry (2002)
Morelhão, Sérgio Luiz; Kycia, Stefan
Source: Resumos. Conference titles: Encontro Nacional de Física da Matéria Condensada. Unidade: IF
Subjects: MAGNETISMO, MATERIAIS MAGNÉTICOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MORELHÃO, Sérgio Luiz e KYCIA, Stefan. Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry. 2002, Anais.. São Paulo: SBF, 2002. . Acesso em: 07 jun. 2024.
APA
Morelhão, S. L., & Kycia, S. (2002). Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry. In Resumos. São Paulo: SBF.
NLM
Morelhão SL, Kycia S. Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry. Resumos. 2002 ;[citado 2024 jun. 07 ]
Vancouver
Morelhão SL, Kycia S. Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry. Resumos. 2002 ;[citado 2024 jun. 07 ]

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