Source: Advanced Materials Research. Unidade: EESC
Subjects: TENSÃO RESIDUAL, ESTANHO, AÇO, PLASMA (MICROELETRÔNICA)
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MIRANDA, Thais Helena Carvalho et al. Influence of Xe ion-bombardment on the substrate microstructure and the residual stresses of TiN coatings deposited by plasma reactive sputtering onto AISI 4140 steel. Advanced Materials Research, v. 996, p. 841-847, 2014Tradução . . Disponível em: https://doi.org/10.4028/www.scientific.net/AMR.996.841. Acesso em: 06 jun. 2024.APA
Miranda, T. H. C., Vales, S. dos S., Ochoa Becerra, E. A., Droppa Junior, R., Brito, P. P., Garcia, J. L., et al. (2014). Influence of Xe ion-bombardment on the substrate microstructure and the residual stresses of TiN coatings deposited by plasma reactive sputtering onto AISI 4140 steel. Advanced Materials Research, 996, 841-847. doi:10.4028/www.scientific.net/AMR.996.841NLM
Miranda THC, Vales S dos S, Ochoa Becerra EA, Droppa Junior R, Brito PP, Garcia JL, Alvarez F, Pinto HC. Influence of Xe ion-bombardment on the substrate microstructure and the residual stresses of TiN coatings deposited by plasma reactive sputtering onto AISI 4140 steel [Internet]. Advanced Materials Research. 2014 ; 996 841-847.[citado 2024 jun. 06 ] Available from: https://doi.org/10.4028/www.scientific.net/AMR.996.841Vancouver
Miranda THC, Vales S dos S, Ochoa Becerra EA, Droppa Junior R, Brito PP, Garcia JL, Alvarez F, Pinto HC. Influence of Xe ion-bombardment on the substrate microstructure and the residual stresses of TiN coatings deposited by plasma reactive sputtering onto AISI 4140 steel [Internet]. Advanced Materials Research. 2014 ; 996 841-847.[citado 2024 jun. 06 ] Available from: https://doi.org/10.4028/www.scientific.net/AMR.996.841
