Source: REVIEW OF SCIENTIFIC INSTRUMENTS. Unidade: IF
Subjects: FILMES FINOS, INSTRUMENTAÇÃO (FÍSICA)
ABNT
BUERGI, J. et al. Reactive sputter magnetron reactor for preparation of thin films and simultaneous in situ structural study by X-ray diffraction. REVIEW OF SCIENTIFIC INSTRUMENTS, v. 84, n. ja2013, p. 015102, 2013Tradução . . Disponível em: https://doi.org/10.1063/1.4773002. Acesso em: 29 maio 2024.APA
Buergi, J., Neuenschwander, R., Kellermann, G., Garcia Molleja, J., Feugeas, J., & Craievich, A. F. (2013). Reactive sputter magnetron reactor for preparation of thin films and simultaneous in situ structural study by X-ray diffraction. REVIEW OF SCIENTIFIC INSTRUMENTS, 84( ja2013), 015102. doi:10.1063/1.4773002NLM
Buergi J, Neuenschwander R, Kellermann G, Garcia Molleja J, Feugeas J, Craievich AF. Reactive sputter magnetron reactor for preparation of thin films and simultaneous in situ structural study by X-ray diffraction [Internet]. REVIEW OF SCIENTIFIC INSTRUMENTS. 2013 ; 84( ja2013): 015102.[citado 2024 maio 29 ] Available from: https://doi.org/10.1063/1.4773002Vancouver
Buergi J, Neuenschwander R, Kellermann G, Garcia Molleja J, Feugeas J, Craievich AF. Reactive sputter magnetron reactor for preparation of thin films and simultaneous in situ structural study by X-ray diffraction [Internet]. REVIEW OF SCIENTIFIC INSTRUMENTS. 2013 ; 84( ja2013): 015102.[citado 2024 maio 29 ] Available from: https://doi.org/10.1063/1.4773002