On the performance degradation of poly(3-hexylthiophene) field-effect transistors (2015)
Source: IEEE Transactions on Device and Materials Reliability. Unidades: IFSC, EP
Subjects: FILMES FINOS, TRANSISTORES
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CAVALLARI, Marco Roberto et al. On the performance degradation of poly(3-hexylthiophene) field-effect transistors. IEEE Transactions on Device and Materials Reliability, v. 15, n. 3, p. 342-351, 2015Tradução . . Disponível em: https://doi.org/10.1109/TDMR.2015.2442239. Acesso em: 29 maio 2024.APA
Cavallari, M. R., Zanchin, V. R., Valle, M. A., Eirez Izquierdo, J. E., Rodríguez, E. M., Gonzalez Rodríguez, E. F., et al. (2015). On the performance degradation of poly(3-hexylthiophene) field-effect transistors. IEEE Transactions on Device and Materials Reliability, 15( 3), 342-351. doi:10.1109/TDMR.2015.2442239NLM
Cavallari MR, Zanchin VR, Valle MA, Eirez Izquierdo JE, Rodríguez EM, Gonzalez Rodríguez EF, Silva M de AP da, Fonseca FJ. On the performance degradation of poly(3-hexylthiophene) field-effect transistors [Internet]. IEEE Transactions on Device and Materials Reliability. 2015 ; 15( 3): 342-351.[citado 2024 maio 29 ] Available from: https://doi.org/10.1109/TDMR.2015.2442239Vancouver
Cavallari MR, Zanchin VR, Valle MA, Eirez Izquierdo JE, Rodríguez EM, Gonzalez Rodríguez EF, Silva M de AP da, Fonseca FJ. On the performance degradation of poly(3-hexylthiophene) field-effect transistors [Internet]. IEEE Transactions on Device and Materials Reliability. 2015 ; 15( 3): 342-351.[citado 2024 maio 29 ] Available from: https://doi.org/10.1109/TDMR.2015.2442239