Young modulus measurement of nanostructured metallic thin films (2004)
Source: Journal of Metastable and Nanocrystalline Materials. Unidade: IF
Subjects: MATERIAIS, FILMES FINOS, NANOTECNOLOGIA
ABNT
VAZ, A R e SALVADORI, Maria Cecília Barbosa da Silveira e CATTANI, Mauro Sérgio Dorsa. Young modulus measurement of nanostructured metallic thin films. Journal of Metastable and Nanocrystalline Materials, 2004Tradução . . Disponível em: http://publica-sbi.if.usp.br/PDFs/pd001.pdf. Acesso em: 09 maio 2024.APA
Vaz, A. R., Salvadori, M. C. B. da S., & Cattani, M. S. D. (2004). Young modulus measurement of nanostructured metallic thin films. Journal of Metastable and Nanocrystalline Materials. Recuperado de http://publica-sbi.if.usp.br/PDFs/pd001.pdfNLM
Vaz AR, Salvadori MCB da S, Cattani MSD. Young modulus measurement of nanostructured metallic thin films [Internet]. Journal of Metastable and Nanocrystalline Materials. 2004 ;[citado 2024 maio 09 ] Available from: http://publica-sbi.if.usp.br/PDFs/pd001.pdfVancouver
Vaz AR, Salvadori MCB da S, Cattani MSD. Young modulus measurement of nanostructured metallic thin films [Internet]. Journal of Metastable and Nanocrystalline Materials. 2004 ;[citado 2024 maio 09 ] Available from: http://publica-sbi.if.usp.br/PDFs/pd001.pdf