Study of electrostic bias by halpha emissivity profile tomography (2005)
Source: Resumos. Conference titles: Encontro Brasileiro de Física dos Plasmas. Unidade: IF
Assunto: FÍSICA DE PLASMAS
ABNT
USURIAGA, O C et al. Study of electrostic bias by halpha emissivity profile tomography. 2005, Anais.. São Paulo: SBF, 2005. Disponível em: http://www.sbf1.sbfisica.org.br/eventos/ebfp/8/sys/resumos/R0108-1.pdf. Acesso em: 24 abr. 2024.APA
Usuriaga, O. C., Galvao, R. M. O., Nascimento, I. C., Kuznetsov, Y. K., Fonseca, A. M. M., Ruchko, L. F., et al. (2005). Study of electrostic bias by halpha emissivity profile tomography. In Resumos. São Paulo: SBF. Recuperado de http://www.sbf1.sbfisica.org.br/eventos/ebfp/8/sys/resumos/R0108-1.pdfNLM
Usuriaga OC, Galvao RMO, Nascimento IC, Kuznetsov YK, Fonseca AMM, Ruchko LF, Sanada EK, Bellintani Junior V. Study of electrostic bias by halpha emissivity profile tomography [Internet]. Resumos. 2005 ;[citado 2024 abr. 24 ] Available from: http://www.sbf1.sbfisica.org.br/eventos/ebfp/8/sys/resumos/R0108-1.pdfVancouver
Usuriaga OC, Galvao RMO, Nascimento IC, Kuznetsov YK, Fonseca AMM, Ruchko LF, Sanada EK, Bellintani Junior V. Study of electrostic bias by halpha emissivity profile tomography [Internet]. Resumos. 2005 ;[citado 2024 abr. 24 ] Available from: http://www.sbf1.sbfisica.org.br/eventos/ebfp/8/sys/resumos/R0108-1.pdf