Nanostructured metallic thin films: measurement of critical exponents (2003)
- Authors:
- USP affiliated authors: SALVADORI, MARIA CECILIA BARBOSA DA SILVEIRA - IF ; CATTANI, MAURO SERGIO DORSA - IF
- Unidade: IF
- Subjects: NANOTECNOLOGIA; FILMES FINOS
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Proceedings
- Volume/Número/Paginação/Ano: Cambridge : NSTI, 2003
- Conference titles: Nanotechnology Conference and Trade Show
-
ABNT
MELO, L L et al. Nanostructured metallic thin films: measurement of critical exponents. 2003, Anais.. Cambridge: NSTI, 2003. . Acesso em: 19 abr. 2024. -
APA
Melo, L. L., Farias, R. de J. C., Salvadori, M. C. B. da S., & Cattani, M. S. D. (2003). Nanostructured metallic thin films: measurement of critical exponents. In Proceedings. Cambridge: NSTI. -
NLM
Melo LL, Farias R de JC, Salvadori MCB da S, Cattani MSD. Nanostructured metallic thin films: measurement of critical exponents. Proceedings. 2003 ;[citado 2024 abr. 19 ] -
Vancouver
Melo LL, Farias R de JC, Salvadori MCB da S, Cattani MSD. Nanostructured metallic thin films: measurement of critical exponents. Proceedings. 2003 ;[citado 2024 abr. 19 ] - Critical exponent measurement of poor quality diamond films
- Dynamic scaling phenomena in diamond film growth
- Critical exponents of diamond films: possible influence of spatially correlated noise
- Metal ion mixing in diamond
- Estudo e fabricação de microbocais sônicos de diamante
- Young modulus measurements of nanostructured palladium thin films
- Nanostructured gold thin films: young modulus measurement
- Young modulus measurement of nanostructured metallic thin films
- Contribution of the morphological grain sizes to the electrical resistivity of platinum and gold thin films
- Diamond surface with hidrogen, oxygen and fluorine terminations
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