Strain effects on the magnetic order of epitaxial 'FE''RH' thin films (2018)
- Autores:
- Autores USP: CORNEJO, DANIEL REINALDO - IF ; MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- DOI: 10.1063/1.5020160
- Assuntos: SUPERCONDUTIVIDADE; FERROMAGNETISMO; NANOPARTÍCULAS
- Idioma: Inglês
- Imprenta:
- Fonte:
- Título do periódico: Journal of Applied Physics
- Volume/Número/Paginação/Ano: v. 124, n. 8, p. 085306, ago. 2018
- Este periódico é de assinatura
- Este artigo é de acesso aberto
- URL de acesso aberto
- Cor do Acesso Aberto: green
- Licença: cc-by-nc-sa
-
ABNT
KUMAR, H. et al. Strain effects on the magnetic order of epitaxial 'FE''RH' thin films. Journal of Applied Physics, v. 124, n. 8, p. 085306, 2018Tradução . . Disponível em: https://aip.scitation.org/doi/10.1063/1.5020160. Acesso em: 26 abr. 2024. -
APA
Kumar, H., Kycia, S., Montellano, I. M., Alvarez, N. R., Alejandro, G., Butera, A., et al. (2018). Strain effects on the magnetic order of epitaxial 'FE''RH' thin films. Journal of Applied Physics, 124( 8), 085306. doi:10.1063/1.5020160 -
NLM
Kumar H, Kycia S, Montellano IM, Alvarez NR, Alejandro G, Butera A, Cornejo DR, Morelhao SL. Strain effects on the magnetic order of epitaxial 'FE''RH' thin films [Internet]. Journal of Applied Physics. 2018 ; 124( 8): 085306.[citado 2024 abr. 26 ] Available from: https://aip.scitation.org/doi/10.1063/1.5020160 -
Vancouver
Kumar H, Kycia S, Montellano IM, Alvarez NR, Alejandro G, Butera A, Cornejo DR, Morelhao SL. Strain effects on the magnetic order of epitaxial 'FE''RH' thin films [Internet]. Journal of Applied Physics. 2018 ; 124( 8): 085306.[citado 2024 abr. 26 ] Available from: https://aip.scitation.org/doi/10.1063/1.5020160 - Epitaxial growth and magnetic properties of 'FE''RH' films prepared on various single-crystal substrates
- Structural and magnetic properties of FeRh films grown on MgO(001) MgO(011) and MgO(111) substrates
- High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
- Enhanced X-ray phase determination by three-beam diffraction
- Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry
- Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity
- An x-ray diffractometer for accurate structural invariant phase determination
- Invariant phase determination by genetic algorithm
- General recursive solution for one-dimensional quantum potentials: a simple tool for applied physics
- An x-ray topography study of the dendritic web silicon growth process
Informações sobre o DOI: 10.1063/1.5020160 (Fonte: oaDOI API)
Download do texto completo
Tipo | Nome | Link | |
---|---|---|---|
Kumar_Strain.pdf | Direct link |
Como citar
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas