Electron diffraction analysis of the structure of 'SI''O IND.2' gel-film (1990)
- Authors:
- Autor USP: AEGERTER, MICHEL ANDRE - IFSC
- Unidade: IFSC
- Assunto: FÍSICA
- Language: Inglês
- Imprenta:
- Publisher: Materials Research Society
- Publisher place: Pittsburgh
- Date published: 1990
- Source:
- Título do periódico: Program and Abstracts
- Conference titles: Spring Meeting of the Materials Research Society
-
ABNT
OHSAKI, H e AEGERTER, M A. Electron diffraction analysis of the structure of 'SI''O IND.2' gel-film. 1990, Anais.. Pittsburgh: Materials Research Society, 1990. . Acesso em: 16 abr. 2024. -
APA
Ohsaki, H., & Aegerter, M. A. (1990). Electron diffraction analysis of the structure of 'SI''O IND.2' gel-film. In Program and Abstracts. Pittsburgh: Materials Research Society. -
NLM
Ohsaki H, Aegerter MA. Electron diffraction analysis of the structure of 'SI''O IND.2' gel-film. Program and Abstracts. 1990 ;[citado 2024 abr. 16 ] -
Vancouver
Ohsaki H, Aegerter MA. Electron diffraction analysis of the structure of 'SI''O IND.2' gel-film. Program and Abstracts. 1990 ;[citado 2024 abr. 16 ] - Estrutura fractal de precursores de vidros e cerâmicas
- Multilayers Si'O IND. 2' and Ti'O IND. 2' coatings on glasses by the sol-gel process
- Raman spectroscopy of 2'NA IND.2'O.1'CA'O.3'SI''O IND.2' glass and glass-ceramics
- Caracterização de vidros de fluoreto de índio utilizando a técnica de EXAFS e espectroscopia Raman
- Síntese de cerâmica supercondutora pelo processo de secagem com fluído supercrítico
- Preparação e caracterização de aerogéis de nióbia
- Saxs studies of the sol-gel-silica glass transformation
- Light scattering studies of stoeber silica particles in solution
- Synthesis, characterization and applications of lead and barium-titanate materials prepared by the sol-gel method
- Electronic energy transfer on fractals
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