Synchrotron radiation X-ray multiple diffraction in the study of KDP phase transition induced by electric field (2000)
- Authors:
- Santos, A O dos - Universidade Estadual de Campinas (UNICAMP)
- Gelamo, R V - Universidade Estadual de Campinas (UNICAMP)
- Cardoso, L P - Universidade Estadual de Campinas (UNICAMP)
- Miranda, M A R - Universidade Federal do Ceará (UFC)
- Nogueira, M A M - Universidade Federal do Ceará (UFC)
- Remedios, C M R - Universidade Federal do Ceará (UFC)
- Melo, F. E. A. - Universidade Federal do Ceará (UFC)
- Sasaki, J M - Universidade Federal do Ceará (UFC)
- Avanci, Luis Humberto
- Morelhao, Sergio Luiz
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- Assunto: MATÉRIA CONDENSADA
- Language: Inglês
- Imprenta:
- Publisher: UFSCAR
- Publisher place: São Carlos
- Date published: 2000
- Source:
- Título do periódico: Resumos
- Conference titles: Congresso Brasileiro de Engenharia e Ciência dos Materiais
-
ABNT
SANTOS, A O dos et al. Synchrotron radiation X-ray multiple diffraction in the study of KDP phase transition induced by electric field. 2000, Anais.. São Carlos: UFSCAR, 2000. . Acesso em: 17 abr. 2024. -
APA
Santos, A. O. dos, Gelamo, R. V., Cardoso, L. P., Miranda, M. A. R., Nogueira, M. A. M., Remedios, C. M. R., et al. (2000). Synchrotron radiation X-ray multiple diffraction in the study of KDP phase transition induced by electric field. In Resumos. São Carlos: UFSCAR. -
NLM
Santos AO dos, Gelamo RV, Cardoso LP, Miranda MAR, Nogueira MAM, Remedios CMR, Melo FEA, Sasaki JM, Avanci LH, Morelhao SL. Synchrotron radiation X-ray multiple diffraction in the study of KDP phase transition induced by electric field. Resumos. 2000 ;[citado 2024 abr. 17 ] -
Vancouver
Santos AO dos, Gelamo RV, Cardoso LP, Miranda MAR, Nogueira MAM, Remedios CMR, Melo FEA, Sasaki JM, Avanci LH, Morelhao SL. Synchrotron radiation X-ray multiple diffraction in the study of KDP phase transition induced by electric field. Resumos. 2000 ;[citado 2024 abr. 17 ] - High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
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