AFM characterization of the spontaneous alignment of InAs quantum-dots along the surface steps (2000)
- Authors:
- USP affiliated authors: QUIVY, ALAIN ANDRE - IF ; MAREGA JUNIOR, EUCLYDES - IFSC
- Unidades: IF; IFSC
- Assunto: MATÉRIA CONDENSADA
- Language: Inglês
- Imprenta:
- Publisher place: Rio de Janeiro
- Date published: 2000
- Source:
- Volume/Número/Paginação/Ano: v.9, p.303-304, Dec.2000
- Conference titles: Brazilian Conference on Microscopy of Materials
-
ABNT
SILVA, M. J. da et al. AFM characterization of the spontaneous alignment of InAs quantum-dots along the surface steps. . Rio de Janeiro: Instituto de Física, Universidade de São Paulo. . Acesso em: 26 abr. 2024. , 2000 -
APA
Silva, M. J. da, Quivy, A. A., González-Borrero, P. P., & Marega Júnior, E. (2000). AFM characterization of the spontaneous alignment of InAs quantum-dots along the surface steps. Rio de Janeiro: Instituto de Física, Universidade de São Paulo. -
NLM
Silva MJ da, Quivy AA, González-Borrero PP, Marega Júnior E. AFM characterization of the spontaneous alignment of InAs quantum-dots along the surface steps. 2000 ;9 303-304.[citado 2024 abr. 26 ] -
Vancouver
Silva MJ da, Quivy AA, González-Borrero PP, Marega Júnior E. AFM characterization of the spontaneous alignment of InAs quantum-dots along the surface steps. 2000 ;9 303-304.[citado 2024 abr. 26 ] - New insights into the full evolution of MBE-grown self-assembled InAs quantum dots by direct comparison of optical and morphological characterization
- AFM and PL characterization of the continuos evolution cycle of MBE-grown self-assembled InAs quantum dots
- AFM characterization of the spontaneous step alignment of InAs quantum dots along their evolution cycle
- Correlation between structural and optical properties of InAs quantum dots along their evolution
- Study of the spontaneous alignment of InAs quantum dots along the surface steps as a function of the InAs coverage
- Maximization of the InAs quantum-dot density through the growth of an intentionally non-homogeneous sample
- Atomic-force microscopy study of self-assembled InAs quantum dots along their complete evolution cycle
- Programa de controle e tratamento de dados para um microscopio de tunelamento
- Medidas de efeito hall para determinacao da concentracao de portadores em amostras dopadas por mbe
- Microscopio de tonelamento operando no ar
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