Advanced image characterization in scanning probe microscopy (2001)
- Authors:
- USP affiliated authors: COSTA, LUCIANO DA FONTOURA - IFSC ; FARIA, ROBERTO MENDONCA - IFSC ; OLIVEIRA JUNIOR, OSVALDO NOVAIS DE - IFSC ; OLIVEIRA, ELISABETH ANDREOLI DE - IF
- Unidades: IFSC; IF
- Subjects: COMPUTAÇÃO GRÁFICA; DIELÉTRICOS; MATÉRIA CONDENSADA
- Language: Inglês
- Imprenta:
- Publisher: IEEE Computer Society
- Publisher place: Los Alamitos
- Date published: 2001
- Source:
- Título do periódico: Proceedings of the XIV SIBGRAPI
- Conference titles: Brazilian Symposium on Computer Graphics and Image Processing
-
ABNT
RODRIGUES, C A et al. Advanced image characterization in scanning probe microscopy. 2001, Anais.. Los Alamitos: IEEE Computer Society, 2001. . Acesso em: 19 abr. 2024. -
APA
Rodrigues, C. A., Pinto, S. C., Costa, L. da F., Faria, R. M., Souza, N. C., Oliveira Junior, O. N. de, et al. (2001). Advanced image characterization in scanning probe microscopy. In Proceedings of the XIV SIBGRAPI. Los Alamitos: IEEE Computer Society. -
NLM
Rodrigues CA, Pinto SC, Costa L da F, Faria RM, Souza NC, Oliveira Junior ON de, Bechtold IH, Oliveira EA de, Bonvent JJ. Advanced image characterization in scanning probe microscopy. Proceedings of the XIV SIBGRAPI. 2001 ;[citado 2024 abr. 19 ] -
Vancouver
Rodrigues CA, Pinto SC, Costa L da F, Faria RM, Souza NC, Oliveira Junior ON de, Bechtold IH, Oliveira EA de, Bonvent JJ. Advanced image characterization in scanning probe microscopy. Proceedings of the XIV SIBGRAPI. 2001 ;[citado 2024 abr. 19 ] - Morphological properties of polymeric films for liquid crystals alignment
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