Synchrotron radiation X-ray multiple diffraction in the study of doped KDP (2001)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- Subjects: MATERIAIS MAGNÉTICOS; PROPRIEDADES DOS MATERIAIS; ESTRUTURA DOS MATERIAIS; DIFRAÇÃO POR RAIOS X
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Resumos
- Conference titles: Encontro Nacional de Física da Matéria Condensada
-
ABNT
AVANCI, Luis Humberto et al. Synchrotron radiation X-ray multiple diffraction in the study of doped KDP. 2001, Anais.. São Paulo: SBF, 2001. . Acesso em: 18 abr. 2024. -
APA
Avanci, L. H., Morelhão, S. L., Cardoso, L. P., Sasaki, J. M., Lai, X., & Roberts, K. J. (2001). Synchrotron radiation X-ray multiple diffraction in the study of doped KDP. In Resumos. São Paulo: SBF. -
NLM
Avanci LH, Morelhão SL, Cardoso LP, Sasaki JM, Lai X, Roberts KJ. Synchrotron radiation X-ray multiple diffraction in the study of doped KDP. Resumos. 2001 ;[citado 2024 abr. 18 ] -
Vancouver
Avanci LH, Morelhão SL, Cardoso LP, Sasaki JM, Lai X, Roberts KJ. Synchrotron radiation X-ray multiple diffraction in the study of doped KDP. Resumos. 2001 ;[citado 2024 abr. 18 ] - High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
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