Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry (2002)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- Subjects: MAGNETISMO; MATERIAIS MAGNÉTICOS
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Resumos
- Conference titles: Encontro Nacional de Física da Matéria Condensada
-
ABNT
MORELHÃO, Sérgio Luiz e KYCIA, Stefan. Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry. 2002, Anais.. São Paulo: SBF, 2002. . Acesso em: 19 abr. 2024. -
APA
Morelhão, S. L., & Kycia, S. (2002). Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry. In Resumos. São Paulo: SBF. -
NLM
Morelhão SL, Kycia S. Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry. Resumos. 2002 ;[citado 2024 abr. 19 ] -
Vancouver
Morelhão SL, Kycia S. Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry. Resumos. 2002 ;[citado 2024 abr. 19 ] - High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
- Enhanced X-ray phase determination by three-beam diffraction
- Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity
- An x-ray diffractometer for accurate structural invariant phase determination
- Invariant phase determination by genetic algorithm
- General recursive solution for one-dimensional quantum potentials: a simple tool for applied physics
- An x-ray topography study of the dendritic web silicon growth process
- Structure refinement of in pure and doped single crystals by synchrotron X-ray Renninger scanning
- O Professor Sergio Morelhão fala sobre "Física Quântica e Neurociência" [Palestra]
- Hybrid reciprocal lattice: application to layer stress appointment in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
