Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity (2002)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- DOI: 10.1016/s0925-8388(02)00342-0
- Subjects: SUPERFÍCIE FÍSICA; FILMES FINOS
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Journal of Alloys and Compounds
- ISSN: 0925-8388
- Volume/Número/Paginação/Ano: v. 344, n. 102, p. 207-211, 2002
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
MORELHÃO, Sérgio Luiz e BRITO, Giancarlo Esposito de Souza e ABRAMOF, Eduardo. Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity. Journal of Alloys and Compounds, v. 344, n. 102, p. 207-211, 2002Tradução . . Disponível em: https://doi.org/10.1016/s0925-8388(02)00342-0. Acesso em: 19 abr. 2024. -
APA
Morelhão, S. L., Brito, G. E. de S., & Abramof, E. (2002). Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity. Journal of Alloys and Compounds, 344( 102), 207-211. doi:10.1016/s0925-8388(02)00342-0 -
NLM
Morelhão SL, Brito GE de S, Abramof E. Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity [Internet]. Journal of Alloys and Compounds. 2002 ; 344( 102): 207-211.[citado 2024 abr. 19 ] Available from: https://doi.org/10.1016/s0925-8388(02)00342-0 -
Vancouver
Morelhão SL, Brito GE de S, Abramof E. Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity [Internet]. Journal of Alloys and Compounds. 2002 ; 344( 102): 207-211.[citado 2024 abr. 19 ] Available from: https://doi.org/10.1016/s0925-8388(02)00342-0 - High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
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Informações sobre o DOI: 10.1016/s0925-8388(02)00342-0 (Fonte: oaDOI API)
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