Currents and charge profiles in electron beam irradiated samples under an applied voltage: exact numerical calculation and Sessler's conductivity approximation (2003)
- Authors:
- USP affiliated authors: FERREIRA, GUILHERME FONTES LEAL - IFSC ; FIGUEIREDO, MARIANGELA TASSINARI DE - IFSC
- Unidade: IFSC
- DOI: 10.1109/TDEI.2003.1176577
- Assunto: FÍSICA DA MATÉRIA CONDENSADA
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: IEEE Transactions on Dielectrics and Electrical Insulation
- ISSN: 1070-9878
- Volume/Número/Paginação/Ano: v. 10, n. 1, p. 137-147, Feb. 2003
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
LEAL FERREIRA, Guilherme Fontes e FIGUEIREDO, Mariângela Tassinari. Currents and charge profiles in electron beam irradiated samples under an applied voltage: exact numerical calculation and Sessler's conductivity approximation. IEEE Transactions on Dielectrics and Electrical Insulation, v. 10, n. 1, p. 137-147, 2003Tradução . . Disponível em: https://doi.org/10.1109/TDEI.2003.1176577. Acesso em: 23 abr. 2024. -
APA
Leal Ferreira, G. F., & Figueiredo, M. T. (2003). Currents and charge profiles in electron beam irradiated samples under an applied voltage: exact numerical calculation and Sessler's conductivity approximation. IEEE Transactions on Dielectrics and Electrical Insulation, 10( 1), 137-147. doi:10.1109/TDEI.2003.1176577 -
NLM
Leal Ferreira GF, Figueiredo MT. Currents and charge profiles in electron beam irradiated samples under an applied voltage: exact numerical calculation and Sessler's conductivity approximation [Internet]. IEEE Transactions on Dielectrics and Electrical Insulation. 2003 ; 10( 1): 137-147.[citado 2024 abr. 23 ] Available from: https://doi.org/10.1109/TDEI.2003.1176577 -
Vancouver
Leal Ferreira GF, Figueiredo MT. Currents and charge profiles in electron beam irradiated samples under an applied voltage: exact numerical calculation and Sessler's conductivity approximation [Internet]. IEEE Transactions on Dielectrics and Electrical Insulation. 2003 ; 10( 1): 137-147.[citado 2024 abr. 23 ] Available from: https://doi.org/10.1109/TDEI.2003.1176577 - Potential buildup in samples charged by successive low-energy pulses
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Informações sobre o DOI: 10.1109/TDEI.2003.1176577 (Fonte: oaDOI API)
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