Secondary emission impaired by charge accumulation in dielectrics: the dynamical method (2005)
- Authors:
- USP affiliated authors: FERREIRA, GUILHERME FONTES LEAL - IFSC ; FIGUEIREDO, MARIANGELA TASSINARI DE - IFSC
- Unidade: IFSC
- Subjects: POLÍMEROS (MATERIAIS); DIELÉTRICOS
- Language: Inglês
- Imprenta:
- Publisher: IEEE Institute of Electrical and Electronics Engineers
- Publisher place: Piscataway
- Date published: 2005
- Source:
- Título do periódico: Proceedings
- Conference titles: International Symposium on Electrets - ISE
-
ABNT
LEAL FERREIRA, Guilherme Fontes e FIGUEIREDO, Mariângela Tassinari de. Secondary emission impaired by charge accumulation in dielectrics: the dynamical method. 2005, Anais.. Piscataway: IEEE Institute of Electrical and Electronics Engineers, 2005. . Acesso em: 19 abr. 2024. -
APA
Leal Ferreira, G. F., & Figueiredo, M. T. de. (2005). Secondary emission impaired by charge accumulation in dielectrics: the dynamical method. In Proceedings. Piscataway: IEEE Institute of Electrical and Electronics Engineers. -
NLM
Leal Ferreira GF, Figueiredo MT de. Secondary emission impaired by charge accumulation in dielectrics: the dynamical method. Proceedings. 2005 ;[citado 2024 abr. 19 ] -
Vancouver
Leal Ferreira GF, Figueiredo MT de. Secondary emission impaired by charge accumulation in dielectrics: the dynamical method. Proceedings. 2005 ;[citado 2024 abr. 19 ] - Potential buildup in samples charged by successive low-energy pulses
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