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TEM, XRD and AFM study of poly(o-ethoxyaniline) films: new evidence for the formation of conducting islands (2008)

  • Authors:
  • USP affiliated authors: MASCARENHAS, YVONNE PRIMERANO - IFSC ; OLIVEIRA JUNIOR, OSVALDO NOVAIS DE - IFSC
  • USP Schools: IFSC; IFSC
  • DOI: 10.1007/s00339-008-4686-9
  • Subjects: RAIOS X; FILMES FINOS; POLÍMEROS (MATERIAIS); NANOTECNOLOGIA; MICROSCOPIA
  • Language: Inglês
  • Imprenta:
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    Informações sobre o DOI: 10.1007/s00339-008-4686-9 (Fonte: oaDOI API)
    • Este periódico é de assinatura
    • Este artigo NÃO é de acesso aberto
    • Cor do Acesso Aberto: closed
    Informações sobre o Citescore
  • Título: Applied Physics A: Materials Science and Processing

    ISSN: 0947-8396

    Citescore - 2017: 1.62

    SJR - 2017: 0.481

    SNIP - 2017: 0.699


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    • ABNT

      LEITE, Fábio L.; ALVES, William F.; MIR, Mirta; et al. TEM, XRD and AFM study of poly(o-ethoxyaniline) films: new evidence for the formation of conducting islands. Applied Physics A, New York, Springer, v. No 2008, n. 2, p. 537-542, 2008. DOI: 10.1007/s00339-008-4686-9.
    • APA

      Leite, F. L., Alves, W. F., Mir, M., Mascarenhas, Y. P., Herrmann, P. S. P., Mattoso, L. H. C., & Oliveira Junior, O. N. de. (2008). TEM, XRD and AFM study of poly(o-ethoxyaniline) films: new evidence for the formation of conducting islands. Applied Physics A, No 2008( 2), 537-542. doi:10.1007/s00339-008-4686-9
    • NLM

      Leite FL, Alves WF, Mir M, Mascarenhas YP, Herrmann PSP, Mattoso LHC, Oliveira Junior ON de. TEM, XRD and AFM study of poly(o-ethoxyaniline) films: new evidence for the formation of conducting islands. Applied Physics A. 2008 ; No 2008( 2): 537-542.
    • Vancouver

      Leite FL, Alves WF, Mir M, Mascarenhas YP, Herrmann PSP, Mattoso LHC, Oliveira Junior ON de. TEM, XRD and AFM study of poly(o-ethoxyaniline) films: new evidence for the formation of conducting islands. Applied Physics A. 2008 ; No 2008( 2): 537-542.

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