Spectral line profile analysis using higher diffraction order in vacuum ultraviolet region (2008)
- Authors:
- USP affiliated authors: NASCIMENTO, IVAN CUNHA - IF ; SANADA, EDSON KENZO - IF ; ELIZONDO, JUAN IRABURU - IF ; KUZNETSOV, YURII - IF ; GALVAO, RICARDO MAGNUS OSORIO - IF
- Unidade: IF
- Assunto: TOKAMAKS
- Language: Inglês
- Imprenta:
- Publisher: The Institute
- Publisher place: New York
- Date published: 2008
- Source:
- Título do periódico: AIP Conference Proceedings
- ISSN: 0094-243X
- Volume/Número/Paginação/Ano: v. 996, p. 235-240, 2008
- Conference titles: IAEA Techinical Meeting on Research Using Small Fusion Devices
-
ABNT
MACHIDA, Munemasa et al. Spectral line profile analysis using higher diffraction order in vacuum ultraviolet region. AIP Conference Proceedings. New York: The Institute. Disponível em: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000996000001000235000001&idtype=cvips&prog=normal. Acesso em: 20 abr. 2024. , 2008 -
APA
Machida, M., Daltrini, A. M., Severo, J. H., Nascimento, I. C., Sanada, E. K., Elizondo, J. I., et al. (2008). Spectral line profile analysis using higher diffraction order in vacuum ultraviolet region. AIP Conference Proceedings. New York: The Institute. Recuperado de http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000996000001000235000001&idtype=cvips&prog=normal -
NLM
Machida M, Daltrini AM, Severo JH, Nascimento IC, Sanada EK, Elizondo JI, Kuznetsov YK, Galvao RMO. Spectral line profile analysis using higher diffraction order in vacuum ultraviolet region [Internet]. AIP Conference Proceedings. 2008 ; 996 235-240.[citado 2024 abr. 20 ] Available from: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000996000001000235000001&idtype=cvips&prog=normal -
Vancouver
Machida M, Daltrini AM, Severo JH, Nascimento IC, Sanada EK, Elizondo JI, Kuznetsov YK, Galvao RMO. Spectral line profile analysis using higher diffraction order in vacuum ultraviolet region [Internet]. AIP Conference Proceedings. 2008 ; 996 235-240.[citado 2024 abr. 20 ] Available from: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000996000001000235000001&idtype=cvips&prog=normal - Impurity line emissions in VUV region of TCABR Tokamak
- Analysis of impurity line emissions using VUV spectrometer in TCABR-USP tokamak
- Comparative analysis of VUV spectral emissions from NOVA-UNICAMP and TCABR-USP tokamak.
- Error analysis in the electron temperature measurements in TCABR
- Measurements of temporal profile of toroidal rotation velocity of carbon impurities in the TCABR tokamak
- New method for temporal evolution of plasma rotation velocity in high-temperature plasma confinement devises
- VUV spectral line emission measurements in the TCABR Tokamak
- Thomson scattering in TCABR: calibration and frist measurements
- Plasma confinement using biased electrode in TCABR tokamak
- Tomography study of H-alpha emissivity in TCABR tokamak discharge with electrostatic bias
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