Hybrid reflections in InGaP/GaAs(001) by synchrotron radiation multiple diffraction (2009)
- Authors:
- - Universidade Estadual de Campinas (UNICAMP)
- Santos, Adenilson Oliveira dos - Universidade Estadual de Campinas (UNICAMP)
- Almeida, Juliana M A - Universidade Estadual de Campinas (UNICAMP)
- Bortoleto, José R R - Universidade Estadual Paulista Júlio de Mesquita Filho (UNESP)
- Cotta, Monica A - Universidade Estadual de Campinas (UNICAMP)
- Morelhão, Sérgio Luiz
- Cardoso, Lisandro Pavie - Universidade Estadual de Campinas (UNICAMP)
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- Subjects: RADIAÇÃO SINCROTRON; DIFRAÇÃO POR RAIOS X
- Language: Inglês
- Imprenta:
- Publisher: Wiley-VCH Verlag
- Publisher place: Weinheim
- Date published: 2009
- Source:
- Título do periódico: Physica Status Solidi B - Basic Solid State Physics
- ISSN: 0370-1972
- Volume/Número/Paginação/Ano: v. 246, n. 3, p, 544-547, 2009
- Conference titles: International Conference on High Pressure Semiconductor Physics
-
ABNT
, et al. Hybrid reflections in InGaP/GaAs(001) by synchrotron radiation multiple diffraction. Physica Status Solidi B - Basic Solid State Physics. Weinheim: Wiley-VCH Verlag. Disponível em: http://www3.interscience.wiley.com/cgi-bin/fulltext/121567354/PDFSTART. Acesso em: 23 abr. 2024. , 2009 -
APA
,, Santos, A. O. dos, Almeida, J. M. A., Bortoleto, J. R. R., Cotta, M. A., Morelhão, S. L., & Cardoso, L. P. (2009). Hybrid reflections in InGaP/GaAs(001) by synchrotron radiation multiple diffraction. Physica Status Solidi B - Basic Solid State Physics. Weinheim: Wiley-VCH Verlag. Recuperado de http://www3.interscience.wiley.com/cgi-bin/fulltext/121567354/PDFSTART -
NLM
, Santos AO dos, Almeida JMA, Bortoleto JRR, Cotta MA, Morelhão SL, Cardoso LP. Hybrid reflections in InGaP/GaAs(001) by synchrotron radiation multiple diffraction [Internet]. Physica Status Solidi B - Basic Solid State Physics. 2009 ; 246( 3):[citado 2024 abr. 23 ] Available from: http://www3.interscience.wiley.com/cgi-bin/fulltext/121567354/PDFSTART -
Vancouver
, Santos AO dos, Almeida JMA, Bortoleto JRR, Cotta MA, Morelhão SL, Cardoso LP. Hybrid reflections in InGaP/GaAs(001) by synchrotron radiation multiple diffraction [Internet]. Physica Status Solidi B - Basic Solid State Physics. 2009 ; 246( 3):[citado 2024 abr. 23 ] Available from: http://www3.interscience.wiley.com/cgi-bin/fulltext/121567354/PDFSTART - High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
- Enhanced X-ray phase determination by three-beam diffraction
- Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry
- Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity
- An x-ray diffractometer for accurate structural invariant phase determination
- Invariant phase determination by genetic algorithm
- General recursive solution for one-dimensional quantum potentials: a simple tool for applied physics
- An x-ray topography study of the dendritic web silicon growth process
- Structure refinement of in pure and doped single crystals by synchrotron X-ray Renninger scanning
- O Professor Sergio Morelhão fala sobre "Física Quântica e Neurociência" [Palestra]
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
