Synchrotron X-ray imaging via ultra-small-angle scattering: principles of quantitative analysis and application in studying bone integration to synthetic grafting materials (2010)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- DOI: 10.1007/s00249-009-0541-y
- Assunto: DIFRAÇÃO POR RAIOS X
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: European Biophysics Journal
- ISSN: 1432-1017
- Volume/Número/Paginação/Ano: v. 39, n. 5, p. 861-865, 2010
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
MORELHÃO, Sérgio Luiz e COELHO, Paulo G e HÖNNICKE, Marcelo G. Synchrotron X-ray imaging via ultra-small-angle scattering: principles of quantitative analysis and application in studying bone integration to synthetic grafting materials. European Biophysics Journal, v. 39, n. 5, p. 861-865, 2010Tradução . . Disponível em: https://doi.org/10.1007/s00249-009-0541-y. Acesso em: 23 abr. 2024. -
APA
Morelhão, S. L., Coelho, P. G., & Hönnicke, M. G. (2010). Synchrotron X-ray imaging via ultra-small-angle scattering: principles of quantitative analysis and application in studying bone integration to synthetic grafting materials. European Biophysics Journal, 39( 5), 861-865. doi:10.1007/s00249-009-0541-y -
NLM
Morelhão SL, Coelho PG, Hönnicke MG. Synchrotron X-ray imaging via ultra-small-angle scattering: principles of quantitative analysis and application in studying bone integration to synthetic grafting materials [Internet]. European Biophysics Journal. 2010 ; 39( 5): 861-865.[citado 2024 abr. 23 ] Available from: https://doi.org/10.1007/s00249-009-0541-y -
Vancouver
Morelhão SL, Coelho PG, Hönnicke MG. Synchrotron X-ray imaging via ultra-small-angle scattering: principles of quantitative analysis and application in studying bone integration to synthetic grafting materials [Internet]. European Biophysics Journal. 2010 ; 39( 5): 861-865.[citado 2024 abr. 23 ] Available from: https://doi.org/10.1007/s00249-009-0541-y - High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
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Informações sobre o DOI: 10.1007/s00249-009-0541-y (Fonte: oaDOI API)
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