A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling (2011)
- Authors:
- USP affiliated authors: STRUM, MARIUS - EP ; CHAU, WANG JIANG - EP
- Unidade: EP
- DOI: 10.1007/s10836-011-5225-8
- Assunto: CIRCUITOS INTEGRADOS
- Language: Inglês
- Imprenta:
- Publisher place: Estados Unidos
- Date published: 2011
- Source:
- Título do periódico: Journal of Electronic Testing
- ISSN: 0923-8174
- Volume/Número/Paginação/Ano: v. 27, n. 4, p. 485-503, mai. 2011
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
CASTRO MÁRQUEZ, Carlos Iván et al. A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling. Journal of Electronic Testing, v. 27, n. 4, p. 485-503, 2011Tradução . . Disponível em: https://doi.org/10.1007/s10836-011-5225-8. Acesso em: 19 abr. 2024. -
APA
Castro Márquez, C. I., Tobar, E. L. R., Strum, M., & Wang, J. C. (2011). A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling. Journal of Electronic Testing, 27( 4), 485-503. doi:10.1007/s10836-011-5225-8 -
NLM
Castro Márquez CI, Tobar ELR, Strum M, Wang JC. A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling [Internet]. Journal of Electronic Testing. 2011 ; 27( 4): 485-503.[citado 2024 abr. 19 ] Available from: https://doi.org/10.1007/s10836-011-5225-8 -
Vancouver
Castro Márquez CI, Tobar ELR, Strum M, Wang JC. A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling [Internet]. Journal of Electronic Testing. 2011 ; 27( 4): 485-503.[citado 2024 abr. 19 ] Available from: https://doi.org/10.1007/s10836-011-5225-8 - Synthesis of multi-burst controllers as standard RS architectures
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Informações sobre o DOI: 10.1007/s10836-011-5225-8 (Fonte: oaDOI API)
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