X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals (2011)
- Authors:
- USP affiliated authors: MORELHAO, SERGIO LUIZ - IF ; FREITAS, RAUL DE OLIVEIRA - IF
- Unidade: IF
- DOI: 10.1107/S0021889810042391
- Assunto: RAIOS X
- Language: Inglês
- Imprenta:
- Publisher place: Copenhagen
- Date published: 2011
- Source:
- Título do periódico: Journal of Applied Crystallography
- Volume/Número/Paginação/Ano: v. 44, n. 1, p. 93-101, fev. 2011
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
MORELHÃO, Sergio L et al. X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals. Journal of Applied Crystallography, v. fe 2011, n. 1, p. 93-101, 2011Tradução . . Disponível em: https://doi.org/10.1107/S0021889810042391. Acesso em: 20 abr. 2024. -
APA
Morelhão, S. L., Remédios, C. M. R., Freitas, R. O., & Santos, A. O. dos. (2011). X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals. Journal of Applied Crystallography, fe 2011( 1), 93-101. doi:10.1107/S0021889810042391 -
NLM
Morelhão SL, Remédios CMR, Freitas RO, Santos AO dos. X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals [Internet]. Journal of Applied Crystallography. 2011 ; fe 2011( 1): 93-101.[citado 2024 abr. 20 ] Available from: https://doi.org/10.1107/S0021889810042391 -
Vancouver
Morelhão SL, Remédios CMR, Freitas RO, Santos AO dos. X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals [Internet]. Journal of Applied Crystallography. 2011 ; fe 2011( 1): 93-101.[citado 2024 abr. 20 ] Available from: https://doi.org/10.1107/S0021889810042391 - Difração bragg-superfície no estudo de sistemas epitaxiais baseados em pontos quânticos de InAs/GaAs
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Informações sobre o DOI: 10.1107/S0021889810042391 (Fonte: oaDOI API)
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