High near-infrared emission intensity of Er3+-doped zirconium oxide films on a Si(100) substrate (2013)
- Authors:
- USP affiliated authors: SILVA, MARCELO DE ASSUMPCAO PEREIRA DA - IFSC ; NUNES, LUIZ ANTONIO DE OLIVEIRA - IFSC ; LI, MAXIMO SIU - IFSC ; MAREGA JUNIOR, EUCLYDES - IFSC
- Unidade: IFSC
- DOI: 10.1117/12.2004783
- Subjects: FILMES FINOS; ESPECTROSCOPIA; TERRAS RARAS
- Language: Inglês
- Imprenta:
- Publisher: International Society for Optical Engineering - SPIE
- Publisher place: Bellingham
- Date published: 2013
- Source:
- Título do periódico: Proceedings of SPIE
- ISSN: 0277-786X
- Volume/Número/Paginação/Ano: v. 8621, p. 86211K-1-86211K-9, 2013
- Conference titles: Optical Components and Materials
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
RIVERA, V. A. G. et al. High near-infrared emission intensity of Er3+-doped zirconium oxide films on a Si(100) substrate. Proceedings of SPIE. Bellingham: International Society for Optical Engineering - SPIE. Disponível em: https://doi.org/10.1117/12.2004783. Acesso em: 19 abr. 2024. , 2013 -
APA
Rivera, V. A. G., Ferri, F. A., Clabel H., J. L., Kawamura, M. K., Silva, M. de A. P. da, Nunes, L. A. de O., et al. (2013). High near-infrared emission intensity of Er3+-doped zirconium oxide films on a Si(100) substrate. Proceedings of SPIE. Bellingham: International Society for Optical Engineering - SPIE. doi:10.1117/12.2004783 -
NLM
Rivera VAG, Ferri FA, Clabel H. JL, Kawamura MK, Silva M de AP da, Nunes LA de O, Siu Li M, Marega Júnior E. High near-infrared emission intensity of Er3+-doped zirconium oxide films on a Si(100) substrate [Internet]. Proceedings of SPIE. 2013 ; 8621 86211K-1-86211K-9.[citado 2024 abr. 19 ] Available from: https://doi.org/10.1117/12.2004783 -
Vancouver
Rivera VAG, Ferri FA, Clabel H. JL, Kawamura MK, Silva M de AP da, Nunes LA de O, Siu Li M, Marega Júnior E. High near-infrared emission intensity of Er3+-doped zirconium oxide films on a Si(100) substrate [Internet]. Proceedings of SPIE. 2013 ; 8621 86211K-1-86211K-9.[citado 2024 abr. 19 ] Available from: https://doi.org/10.1117/12.2004783 - High red emission intensity of Eu:Y2O3 films grown on Si(1 0 0)/Si (1 1 1) by electron beam evaporation
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- Near-infrared light emission of Er3+-doped zirconium oxide thin films: an optical, structural and XPS study
- Ag induced modifications on W 'O IND.3' films studied by AFM, Raman and x-ray photoelectron spectroscopy
- Absorcao optica e relaxacao dieletrica de ions 'CU POT.+' Em filmes de k'CL'
- Hight-resolution photoelectron spectroscopy studies on W'O IND.3' films modified by Ag addition
- Propriedades otica e estrutural de filmes de k'BR': 'CU POT.+'
- Correlacao entre as propriedades oticas e a microestrutura de filmes de k'BR': 'CU POT.+' Em diferentes temperaturas do substrato
Informações sobre o DOI: 10.1117/12.2004783 (Fonte: oaDOI API)
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