Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates (2016)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- DOI: 10.1107/S1600576716004441
- Subjects: SEMICONDUTORES; RAIOS X
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Journal of Applied Crystallography
- Volume/Número/Paginação/Ano: v. 49, n. 3, p. 798-805, jun. 2016
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
DOMAGALA, Jaroslaw Z. et al. Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. Journal of Applied Crystallography, v. 49, n. ju 2016, p. 798-805, 2016Tradução . . Disponível em: https://doi.org/10.1107/S1600576716004441. Acesso em: 20 abr. 2024. -
APA
Domagala, J. Z., Sarzynski, M., Mazdziarz, M., Dluzewski, P., Leszczynski, M., & Morelhao, S. L. (2016). Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. Journal of Applied Crystallography, 49( ju 2016), 798-805. doi:10.1107/S1600576716004441 -
NLM
Domagala JZ, Sarzynski M, Mazdziarz M, Dluzewski P, Leszczynski M, Morelhao SL. Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates [Internet]. Journal of Applied Crystallography. 2016 ; 49( ju 2016): 798-805.[citado 2024 abr. 20 ] Available from: https://doi.org/10.1107/S1600576716004441 -
Vancouver
Domagala JZ, Sarzynski M, Mazdziarz M, Dluzewski P, Leszczynski M, Morelhao SL. Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates [Internet]. Journal of Applied Crystallography. 2016 ; 49( ju 2016): 798-805.[citado 2024 abr. 20 ] Available from: https://doi.org/10.1107/S1600576716004441 - High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
- Enhanced X-ray phase determination by three-beam diffraction
- Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry
- Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity
- An x-ray diffractometer for accurate structural invariant phase determination
- Invariant phase determination by genetic algorithm
- General recursive solution for one-dimensional quantum potentials: a simple tool for applied physics
- An x-ray topography study of the dendritic web silicon growth process
- Structure refinement of in pure and doped single crystals by synchrotron X-ray Renninger scanning
- O Professor Sergio Morelhão fala sobre "Física Quântica e Neurociência" [Palestra]
Informações sobre o DOI: 10.1107/S1600576716004441 (Fonte: oaDOI API)
Download do texto completo
| Tipo | Nome | Link | |
|---|---|---|---|
 | Journal of Applied Crysta... | Direct link |
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
