Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications (2018)
- Authors:
- Silva, Tiago Fiorini da
- Rodrigues, Cleber Lima
- Added, Nemitala
- Rizzutto, Marcia de Almeida
- Tabacniks, Manfredo Harri
- Mangiarotti, Alessio
- Curado, Jessica Fleury
- Aguirre, Fernando Rodrigues
- Aguero, Natasha Fioretto
- Allegro, Paula Rangel Pestana
- Campos, Pedro Herzilio Ottoni Viviani de
- Restrepo Arteta, Juan Manuel
- Trindade, Gustavo Ferraz
- Rodrigues, Antonio Marcos
- Assis, Renan Ferreira de
- Leite, Alisson Rodolfo
- USP affiliated authors: SILVA, TIAGO FIORINI DA - IF ; RODRIGUES, CLEBER LIMA - IF ; ADDED, NEMITALA - IF ; RIZZUTTO, MARCIA DE ALMEIDA - IF ; TABACNIKS, MANFREDO HARRI - IF ; ASSIS, RENAN FERREIRA DE - IF ; LEITE, ALISSON RODOLFO - IF
- Unidade: IF
- DOI: 10.1016/j.nimb.2018.03.006
- Subjects: FEIXES; LABORATÓRIOS; FÍSICA EXPERIMENTAL
- Keywords: ELEMENTAL MAPPING; ION BEAM ANALYSIS; EXTERNAL BEAM; LARGE AREA; LAMFI-USP; MAPEAMENTO ELEMENTAR; ANALISE DE FEIXES DE ÍONS
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- ISSN: 0168-583X
- Volume/Número/Paginação/Ano: v.422, p. 68-77,2018
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
SILVA, Tiago Fiorini da et al. Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, v. 422, p. 68-77, 2018Tradução . . Disponível em: https://doi.org/10.1016/j.nimb.2018.03.006. Acesso em: 23 abr. 2024. -
APA
Silva, T. F. da, Rodrigues, C. L., Added, N., Rizzutto, M. de A., Tabacniks, M. H., Mangiarotti, A., et al. (2018). Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 422, 68-77. doi:10.1016/j.nimb.2018.03.006 -
NLM
Silva TF da, Rodrigues CL, Added N, Rizzutto M de A, Tabacniks MH, Mangiarotti A, Curado JF, Aguirre FR, Aguero NF, Allegro PRP, Campos PHOV de, Restrepo Arteta JM, Trindade GF, Rodrigues AM, Assis RF de, Leite AR. Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications [Internet]. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2018 ;422 68-77.[citado 2024 abr. 23 ] Available from: https://doi.org/10.1016/j.nimb.2018.03.006 -
Vancouver
Silva TF da, Rodrigues CL, Added N, Rizzutto M de A, Tabacniks MH, Mangiarotti A, Curado JF, Aguirre FR, Aguero NF, Allegro PRP, Campos PHOV de, Restrepo Arteta JM, Trindade GF, Rodrigues AM, Assis RF de, Leite AR. Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications [Internet]. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2018 ;422 68-77.[citado 2024 abr. 23 ] Available from: https://doi.org/10.1016/j.nimb.2018.03.006 - Studying total dose irradiation on a power transistor
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Informações sobre o DOI: 10.1016/j.nimb.2018.03.006 (Fonte: oaDOI API)
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