Micro grain analysis in plastically deformed silicon by 2nd-order X-ray diffraction (2018)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- DOI: 10.1557/adv.2018.511
- Subjects: DIFRAÇÃO POR RAIOS X; SEMICONDUTORES; CRISTALOGRAFIA DE RAIOS X
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: MRS Advances
- Volume/Número/Paginação/Ano: v. 3, n. 39, p. 2347-2352, jun. 2018
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
DINA, Gabriel et al. Micro grain analysis in plastically deformed silicon by 2nd-order X-ray diffraction. MRS Advances, v. 3, n. ju 2018, p. 2347-2352, 2018Tradução . . Disponível em: https://doi.org/10.1557/adv.2018.511. Acesso em: 24 abr. 2024. -
APA
Dina, G., Kycia, S., Gonzalez, A. G., & Morelhao, S. L. (2018). Micro grain analysis in plastically deformed silicon by 2nd-order X-ray diffraction. MRS Advances, 3( ju 2018), 2347-2352. doi:10.1557/adv.2018.511 -
NLM
Dina G, Kycia S, Gonzalez AG, Morelhao SL. Micro grain analysis in plastically deformed silicon by 2nd-order X-ray diffraction [Internet]. MRS Advances. 2018 ; 3( ju 2018): 2347-2352.[citado 2024 abr. 24 ] Available from: https://doi.org/10.1557/adv.2018.511 -
Vancouver
Dina G, Kycia S, Gonzalez AG, Morelhao SL. Micro grain analysis in plastically deformed silicon by 2nd-order X-ray diffraction [Internet]. MRS Advances. 2018 ; 3( ju 2018): 2347-2352.[citado 2024 abr. 24 ] Available from: https://doi.org/10.1557/adv.2018.511 - High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
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Informações sobre o DOI: 10.1557/adv.2018.511 (Fonte: oaDOI API)
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