X-ray tools for van der waals epitaxy of bismuth telluride topological insulator films (2018)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- Subjects: DIFRAÇÃO POR RAIOS X; SEMICONDUTORES; CRISTALOGRAFIA DE RAIOS X
- Language: Inglês
- Imprenta:
-
ABNT
KYCIA, Stefan et al. X-ray tools for van der waals epitaxy of bismuth telluride topological insulator films. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/abs/1812.10804. Acesso em: 19 abr. 2024. , 2018 -
APA
Kycia, S., Netzke, S., Fornari, C. I., Rappl, P. H. O., Abramof, E., & Morelhao, S. L. (2018). X-ray tools for van der waals epitaxy of bismuth telluride topological insulator films. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/abs/1812.10804 -
NLM
Kycia S, Netzke S, Fornari CI, Rappl PHO, Abramof E, Morelhao SL. X-ray tools for van der waals epitaxy of bismuth telluride topological insulator films [Internet]. 2018 ;[citado 2024 abr. 19 ] Available from: https://arxiv.org/abs/1812.10804 -
Vancouver
Kycia S, Netzke S, Fornari CI, Rappl PHO, Abramof E, Morelhao SL. X-ray tools for van der waals epitaxy of bismuth telluride topological insulator films [Internet]. 2018 ;[citado 2024 abr. 19 ] Available from: https://arxiv.org/abs/1812.10804 - High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
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