Corrections in Single Event Effects cross section (2018)
- Authors:
- USP affiliated authors: MEDINA, NILBERTO HEDER - IF ; ADDED, NEMITALA - IF ; MENEGASSO, RICARDO - IF ; MACCHIONE, EDUARDO LUIZ AUGUSTO - IF ; RIBAS, ROBERTO VICENCOTTO - IF
- Unidade: IF
- Subjects: FÍSICA NUCLEAR; RADIAÇÃO IONIZANTE
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Abstracts
- Conference titles: Brazilian Meeting on Nuclear Physics
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ABNT
ADDED, Nemitala et al. Corrections in Single Event Effects cross section. 2018, Anais.. São Paulo: SBF, 2018. Disponível em: https://sec.sbfisica.org.br/eventos/rtfnb/xli/sys/resumos/R0068-1.pdf. Acesso em: 24 abr. 2024. -
APA
Added, N., Aguiar, V. Â. P. de, Aguirre, F. R., Medina, N. H., & Silveira, M. A. G. da. (2018). Corrections in Single Event Effects cross section. In Abstracts. São Paulo: SBF. Recuperado de https://sec.sbfisica.org.br/eventos/rtfnb/xli/sys/resumos/R0068-1.pdf -
NLM
Added N, Aguiar VÂP de, Aguirre FR, Medina NH, Silveira MAG da. Corrections in Single Event Effects cross section [Internet]. Abstracts. 2018 ;[citado 2024 abr. 24 ] Available from: https://sec.sbfisica.org.br/eventos/rtfnb/xli/sys/resumos/R0068-1.pdf -
Vancouver
Added N, Aguiar VÂP de, Aguirre FR, Medina NH, Silveira MAG da. Corrections in Single Event Effects cross section [Internet]. Abstracts. 2018 ;[citado 2024 abr. 24 ] Available from: https://sec.sbfisica.org.br/eventos/rtfnb/xli/sys/resumos/R0068-1.pdf - Destructive single-event effects in semiconductor devices
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