Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy (2020)
- Authors:
- USP affiliated authors: ADDED, NEMITALA - IF ; MEDINA, NILBERTO HEDER - IF ; MACCHIONE, EDUARDO LUIZ AUGUSTO - IF ; AGUIAR, VITOR ÂNGELO PAULINO DE - IF
- Unidade: IF
- DOI: 10.1109/TNS.2019.2952775
- Assunto: ÍONS PESADOS
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Publisher place: Piscataway, NJ
- Date published: 2020
- Source:
- Título do periódico: IEEE Transactions on Nuclear Science
- Volume/Número/Paginação/Ano: v.. 67, n. 3, p. 518-524, 2020
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
GONZÁLEZ, Carlos J et al. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy. IEEE Transactions on Nuclear Science, v. . 67, n. 3, p. 518-524, 2020Tradução . . Disponível em: https://doi.org/10.1109/TNS.2019.2952775. Acesso em: 03 jun. 2024. -
APA
González, C. J., Added, N., Macchione, E. L. A., Aguiar, V. Â. P. de, Kastensmidt, F. G. L., Puchner, H. K., et al. (2020). Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy. IEEE Transactions on Nuclear Science, . 67( 3), 518-524. doi:10.1109/TNS.2019.2952775 -
NLM
González CJ, Added N, Macchione ELA, Aguiar VÂP de, Kastensmidt FGL, Puchner HK, Guazzelli MA, Medina NH, Balen TR. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy [Internet]. IEEE Transactions on Nuclear Science. 2020 ;. 67( 3): 518-524.[citado 2024 jun. 03 ] Available from: https://doi.org/10.1109/TNS.2019.2952775 -
Vancouver
González CJ, Added N, Macchione ELA, Aguiar VÂP de, Kastensmidt FGL, Puchner HK, Guazzelli MA, Medina NH, Balen TR. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy [Internet]. IEEE Transactions on Nuclear Science. 2020 ;. 67( 3): 518-524.[citado 2024 jun. 03 ] Available from: https://doi.org/10.1109/TNS.2019.2952775 - Neutron radiation effects on an electronic system on module
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Informações sobre o DOI: 10.1109/TNS.2019.2952775 (Fonte: oaDOI API)
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