Oliveira, A; Added, Nemitala 
; Medina, Nilberto Heder
Source: Microelectronics Reliability Volumes 100–101, September 2019, 113437. Unidade: IF
Assunto: ÍONS PESADOS
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ABNT
OLIVEIRA, A e ADDED, Nemitala e MEDINA, Nilberto Heder. Dynamic heavy ions SEE testing of NanoXplore radiation hardened SRAM-based FPGA: Reliability-performance analysis. Microelectronics Reliability Volumes 100–101, September 2019, 113437, v. 100–101, 2019Tradução . . Disponível em: https://doi.org/10.1016/j.microrel.2019.113437. Acesso em: 01 jun. 2024.APA
Oliveira, A., Added, N., & Medina, N. H. (2019). Dynamic heavy ions SEE testing of NanoXplore radiation hardened SRAM-based FPGA: Reliability-performance analysis. Microelectronics Reliability Volumes 100–101, September 2019, 113437, 100–101. doi:10.1016/j.microrel.2019.113437NLM
Oliveira A, Added N, Medina NH. Dynamic heavy ions SEE testing of NanoXplore radiation hardened SRAM-based FPGA: Reliability-performance analysis [Internet]. Microelectronics Reliability Volumes 100–101, September 2019, 113437. 2019 ; 100–101[citado 2024 jun. 01 ] Available from: https://doi.org/10.1016/j.microrel.2019.113437Vancouver
Oliveira A, Added N, Medina NH. Dynamic heavy ions SEE testing of NanoXplore radiation hardened SRAM-based FPGA: Reliability-performance analysis [Internet]. Microelectronics Reliability Volumes 100–101, September 2019, 113437. 2019 ; 100–101[citado 2024 jun. 01 ] Available from: https://doi.org/10.1016/j.microrel.2019.113437
