TY - JOUR TI - Correlation energy of coupled double electron layers PY - 2003 AU - Candido, L. AU - Hai, Guo-Qiang T2 - Microelectronics Journal SN - 0026-2692 DO - 10.1016/s0026-2692(03)00050-8 UR - https://doi.org/10.1016/s0026-2692(03)00050-8 PP - Oxford VL - 34 IS - 5/8 SP - 569-570 ER -