@article{article52426d7b,
title   = {RTN assessment of traps in polysilicon cylindrical vertical FETs for NVM application},
author = {Caño de Andrade, Maria Glória and Martino, João Antonio and Toledano, M and Fourati, Fatima and Degraeve, Robin and Claeys, Cor and Simoen, Eddy and Van den Bosch, Geert and Van Houdt, Jan},
year = {2013},
doi = {10.1016/j.mee.2013.03.019},
journal   = {Microelectronic Engineering Volume 109, September 2013, Pages 105-108}
}