González, Carlos J; Added, Nemitala 
; Macchione, Eduardo Luiz Augusto ; Aguiar, Vitor Ângelo Paulino de ; Kastensmidt, Fernanda G L; Puchner, Helmut K; Guazzelli, Marcilei A ; Medina, Nilberto Heder ; Balen, Tiago R
Source: IEEE Transactions on Nuclear Science. Unidade: IF
Assunto: ÍONS PESADOS
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GONZÁLEZ, Carlos J et al. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy. IEEE Transactions on Nuclear Science, v. . 67, n. 3, p. 518-524, 2020Tradução . . Disponível em: https://doi.org/10.1109/TNS.2019.2952775. Acesso em: 03 jun. 2024.APA
González, C. J., Added, N., Macchione, E. L. A., Aguiar, V. Â. P. de, Kastensmidt, F. G. L., Puchner, H. K., et al. (2020). Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy. IEEE Transactions on Nuclear Science, . 67( 3), 518-524. doi:10.1109/TNS.2019.2952775NLM
González CJ, Added N, Macchione ELA, Aguiar VÂP de, Kastensmidt FGL, Puchner HK, Guazzelli MA, Medina NH, Balen TR. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy [Internet]. IEEE Transactions on Nuclear Science. 2020 ;. 67( 3): 518-524.[citado 2024 jun. 03 ] Available from: https://doi.org/10.1109/TNS.2019.2952775Vancouver
González CJ, Added N, Macchione ELA, Aguiar VÂP de, Kastensmidt FGL, Puchner HK, Guazzelli MA, Medina NH, Balen TR. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy [Internet]. IEEE Transactions on Nuclear Science. 2020 ;. 67( 3): 518-524.[citado 2024 jun. 03 ] Available from: https://doi.org/10.1109/TNS.2019.2952775
